Find Out More About ATSPID
ATSPID is a global leader in semiconductor test ware solutions for high speed (6.4 GHz+), mixed signals and R/F applications. With over 50 years of test design and engineering expertise, our principals are recognized experts in Semiconductor testing and Automatic Test Equipment (ATE) design. We offer customized, high quality Probe Cards, Final Test DUT boards, Characterization Boards, and Burn-In Boards. ATSPID also provides sockets, docking plates and stiffeners used in semiconductor test equipment. Our customized solutions enable you to effortlessly conduct frontend (pre-packaging) and backend (post-packaging) tests for microprocessors, ASICS, processors, video processors, storage chips, game chips, audio chips, network processors, and much more. As a full service firm combining expertise in circuit board (PCB) design & engineering, layout, fabrication, assembly, and quality assurance, ATSPID is proud to provide complete 24/7 turn-key services. Our strong partnerships with the two largest and most advanced PCB fabrication houses allow us to provide the most cost-effective solutions to our customers. Our customersOur customers include the world top two semiconductor companies, largest workstation company, largest semiconductor test equipment company, and world most advanced probe card company. Our Philosophy
Expertise, accuracy, and fast design execution are our norms We provide the best solutions for the most challenging high speed applications. We deliver excellent services and solutions ahead of time and within budget. "Timing is everything – We always deliver the design on time. Our products work every time, all the time" – Alexander Dang, President and Founder of ATSPIDManagement
Prior to founding ATSPID, Alexander was a technical consultant with Credence Test Systems. He has also held various senior management positions at Vitesse, Cypress, ECTS, Xilinx, Teradyne, LTX, and Intel. Alexander holds patents in the area of semiconductor testing design and engineering. Historical Timeline2012
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